CSIR-Indian Institute of Integrative Medicine
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Application of scanning electron microscopy to failure analysis in ceramics and glasses

by Mecholsky, J.J.
Type: materialTypeLabelBookPublisher: National Technical Information Service, Description: 31p.Subject(s): Cerebellum | ANALYSIS | APPLICATION | CERAMICS | ELECTRON | FAILURE | GLASSES | MICROSCOPY | SCANNINGOnline resources: http://library.iiim.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=25292
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