Normal view MARC view ISBD view

Practical methods in Electron Microscopy Glauert, Audrey M.; ed. - Amsterdam: Elsevier, 1985 - xiii, 206p.

ISBN: 0-444-80699-7

Subjects--Topical Terms:
electropolishing
ion beem thinning
mechanical teachniques
Mounting
Practiale Hints
Replaca techniques
stoning specimens
ulk specimens-initial p

Subjects--Index Terms: ELECTRON FOIL MICROSCOPY PREPARATION THIN

Universal Decimal Class. No.: 578.6:537.533