000 -LEADER | |
---|---|
fixed length control field | 01115nam a2200373Ia 4500 |
001 - CONTROL NUMBER | |
control field | 22753 |
003 - CONTROL NUMBER IDENTIFIER | |
control field | CSIR-IIIM |
005 - DATE AND TIME OF LATEST TRANSACTION | |
control field | 20191218123329.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
fixed length control field | 130912s9999 xx 000 0 und d |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
International Standard Book Number | 0-444-80699-7 |
040 ## - CATALOGING SOURCE | |
Transcribing agency | CSIR-IIIM |
Original cataloging agency | CSIR-IIIM |
Language of cataloging | english |
080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER | |
Universal Decimal Classification number | 578.6:537.533 |
100 ## - MAIN ENTRY--PERSONAL NAME | |
Relator code | Glauert, Audrey M.; ed. |
245 ## - TITLE STATEMENT | |
Title | Practical methods in Electron Microscopy |
Statement of responsibility, etc. | Glauert, Audrey M.; ed. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Place of publication, distribution, etc. | Amsterdam: |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Name of publisher, distributor, etc. | Elsevier, |
260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
Date of publication, distribution, etc. | 1985 |
300 ## - PHYSICAL DESCRIPTION | |
Extent | xiii, 206p. |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | electropolishing |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | ion beem thinning |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | mechanical teachniques |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Mounting |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Practiale Hints |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | Replaca techniques |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | stoning specimens |
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
Topical term or geographic name as entry element | ulk specimens-initial p |
653 ## - INDEX TERM--UNCONTROLLED | |
Uncontrolled term | ELECTRON |
653 ## - INDEX TERM--UNCONTROLLED | |
Uncontrolled term | FOIL |
653 ## - INDEX TERM--UNCONTROLLED | |
Uncontrolled term | MICROSCOPY |
653 ## - INDEX TERM--UNCONTROLLED | |
Uncontrolled term | PREPARATION |
653 ## - INDEX TERM--UNCONTROLLED | |
Uncontrolled term | THIN |
856 ## - ELECTRONIC LOCATION AND ACCESS | |
Uniform Resource Identifier | http://library.iiim.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=3654 |
Link text | http://library.iiim.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=3654 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
Koha item type | Books |
Source of classification or shelving scheme | |
Call number prefix | 578.6:537.533 |
Call number suffix | L5.11 |
Price effective from | Permanent Location | Date last seen | Not for loan | Date acquired | Source of classification or shelving scheme | Koha item type | Barcode | Damaged status | Lost status | Serial Enumeration / chronology | Withdrawn status | Current Location | Public note | Full call number |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
2013-09-12 | CSIR - IIIM JAMMU | 2013-09-12 | 2013-09-12 | Books | 22753 | V.11 | CSIR - IIIM JAMMU | Thin foil preparation for electron microscopy | 578.6:537.533 L5.11 | |||||
2019-12-18 | CSIR - IIIM JAMMU | 2019-12-18 | 2019-12-18 | Books | 21339 | V.5 | CSIR - IIIM JAMMU | Part 1 Staining methods for sectioned material Part-2 X-Ray Micro analysis in the electron microscope | 578.6:537.533 L5.5 | |||||
2019-12-18 | CSIR - IIIM JAMMU | 2019-12-18 | 2019-12-18 | Books | 22879 | V.7 | CSIR - IIIM JAMMU | Image Analysis, enhancement and interpretation | 578.6:537.533 L5.7 | |||||
2019-12-24 | CSIR - IIIM JAMMU | 2019-12-24 | 2019-12-24 | Books | 22752 | V.10 | CSIR - IIIM JAMMU | Low temperature methods in biological electron microscopy | 578.6:537.533 L5.10 | |||||
2019-12-26 | CSIR - IIIM JAMMU | 2019-12-26 | 2019-12-26 | Books | 22779 | V.8 | CSIR - IIIM JAMMU | Replica, Shadowing and Freeze-Etching Techniques | 578.6:537.533 L5.8 | |||||
2019-12-26 | CSIR - IIIM JAMMU | 2019-12-26 | 2019-12-26 | Books | 22880 | V.9 | CSIR - IIIM JAMMU | Dynamic experiments in the Electron Microscope | 578.6:537.533 L5.9 |